June 26, 2007 - EDAX Inc., a provider of X-ray microanalysis and electron diffraction instrumentation, announced its performance advancements on the Hikari electron backscatter detector, releasing the OIM 5.2 software, including a pattern collection and indexing rate of 320 pps.
“Twelve months ago, EDAX launched the Hikari EBSD detector, the first detector with a pattern collection and indexing rate exceeding 200pps. With the release of the OIM 5.2 software, users can expect around 320pps with similar indexing accuracy,” explains Del Redfern, Product Marketing Manager at EDAX.
For more information: www.edax.com